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Andreja Jelen: Nanoscience Using FIB-SEM Nanolaboratory

Date: 10. 1. 2018
Source: Monday physics colloquium
Ponedeljek, 15. 1. 2018 ob 16.15 v predavalnici F1, UL FMF, Jadranska 19, Ljubljana

Nanoscience Using FIB-SEM Nanolaboratory

Dr. Andreja Jelen

Jožef Stefan Institute, Condensed Matter Physics Dept., Ljubljana

FIB-SEM (Focused Ion Beam ‒ Scanning Electron Microscope) nanolaboratory is a versatile tool for interacting with solid materials at the micro and nano level.  It is a dual beam scanning electron microscope that operates with focused electrons e- and focused ions, usually Ga+. Mostly performed activities in FIB-SEM nanolaboratory are: imaging at the nanoscale, cross-sectioning, EDS (Energy Dispersive Spectroscopy) chemical analysis, nanotomography, 3D reconstruction of materials microstructure, nanofabrication and TEM (Transmission Electron Microscope) thin foil samples preparation. The purpose of this talk is to give a brief description of FIB-SEM dual beam system and present some results on high-entropy alloy materials.



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