Domov > Obvestila > Prof. P. Pelicon (IJS): High energy focused ion beams: technology and applications

Prof. P. Pelicon (IJS): High energy focused ion beams: technology and applications

Datum objave: 10. 2. 2020
Vir: Ponedeljkov fizikalni kolokvij
Ponedeljek, 17.2.2020, ob 16:15 v predavalnici F1, Jadranska 19

Prof. P. Pelicon (IJS):

High energy focused ion beams: technology and applications

Povzetek / Abstract:

Ions with energies in the MeV range ionize the inner atomic shells and induce the emission of characteristic X-rays without a pronounced background, enabling the detection of elements with concentration of 0.1 ppm. The collision of a high energy heavy ion with the surface of insulating material ejects in the vacuum a high fraction of nonfragmented molecular ions with masses exceeding 1kDa. If we raster scan the biological tissue with a high energy focused ion beam, we exploit these two physical processes to extract the chemical image. Examples of elemental imaging by micro-PIXE and molecular imaging by MeV-SIMS at the microprobe of the Ljubljana tandem accelerator will be presented.

Predavanje bo v angleščini / Lecture will be held in English

Ponedeljek, 17.2.2020, ob 16:15, v predavalnici F1 na Jadranski 19

Ob 16:00 vabimo udeležence na čaj